Successive pattern classification based on test feature classifier and its application to defect image classification.
Yukinobu SakataShun'ichi KanekoYuji TakagiHirohito OkudaPublished in: Pattern Recognit. (2005)
Keyphrases
- pattern classification
- image classification
- nearest neighbor rule
- feature extraction
- fuzzy classifier
- feature set
- probabilistic neural network
- pattern classification problems
- decision boundary
- image features
- svm classifier
- feature vectors
- feature space
- pattern recognition
- feature selection
- spatial pyramid
- training data
- sparse representation
- image processing
- radial basis function neural network
- image representation
- neural network
- decision trees
- mass spectrometry data
- parzen window
- class specific
- support vector
- face recognition
- linear classifiers
- feature representation
- extracted features
- random forest
- fuzzy classification
- class labels
- support vector machine
- classification accuracy