Discriminative metric design for robust pattern recognition.
Hideyuki WatanabeTsuyoshi YamaguchiShigeru KatagiriPublished in: IEEE Trans. Signal Process. (1997)
Keyphrases
- pattern recognition
- real time
- design decisions
- computer vision
- design process
- neural network
- pattern classification
- computer aided
- computationally efficient
- semi supervised
- knowledge base
- data mining
- feature extraction
- knowledge based systems
- image processing
- software architecture
- learning algorithm
- information retrieval
- engineering design
- pattern recognition problems