Discriminative metric design for robust pattern recognition.

Hideyuki Watanabe Tsuyoshi Yamaguchi Shigeru Katagiri

Published in: IEEE Trans. Signal Process. (1997)

Keyphrases

pattern recognition
real time
design decisions
computer vision
design process

neural network
pattern classification
computer aided
computationally efficient
semi supervised

knowledge base
data mining
feature extraction
knowledge based systems
image processing

software architecture
learning algorithm
information retrieval
engineering design
pattern recognition problems