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A Probabilistic Method to Detect Anomalies in Embedded Systems.

Mahroo ZandrahimiAlireza ZareiHamid R. Zarandi
Published in: DFT (2010)
Keyphrases
  • embedded systems
  • probabilistic model
  • bayesian networks
  • learning algorithm
  • artificial intelligence
  • high level
  • data structure
  • feature space
  • pairwise
  • high dimensional
  • source code
  • computing power