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Overview of catastrophic failures of freewheeling diodes in power electronic circuits.

Rui WuFrede BlaabjergHuai WangMarco Liserre
Published in: Microelectron. Reliab. (2013)
Keyphrases
  • electronic circuits
  • parallel processing
  • power consumption
  • failure detection
  • high density
  • graduate school
  • database systems
  • statistically significant
  • room temperature
  • thin film transistor