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Overview of catastrophic failures of freewheeling diodes in power electronic circuits.
Rui Wu
Frede Blaabjerg
Huai Wang
Marco Liserre
Published in:
Microelectron. Reliab. (2013)
Keyphrases
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electronic circuits
parallel processing
power consumption
failure detection
high density
graduate school
database systems
statistically significant
room temperature
thin film transistor