Robust Image Wafer Inspection.

Massimiliano Barone

Published in: IPTA (2020)

Keyphrases

input image
image noise
single image
multiscale
image data
image analysis
template matching
image representation
image content
image retrieval
image features
image regions
geometric distortions
partial occlusion
lighting conditions
hough transform
segmentation method
feature points
pixel values
image segmentation
image matching
image structure
light source
vector field
region of interest
image pixels
low level