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GAN-based Defect Image Generation for Imbalanced Defect Classification of OLED panels.
Yongmoon Jeon
Haneol Kim
Hyeona Lee
Seonghoon Jo
Jaewon Kim
Published in:
EGSR (ST) (2022)
Keyphrases
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image generation
defect classification
high resolution
image composition
digital imaging
three dimensional
computer vision