A max-cut approach to heterogeneity in cryo-electron microscopy.

Yariv Aizenbud Yoel Shkolnisky

Published in: CoRR (2016)

Keyphrases

electron microscopy
max cut
x ray
low energy
graph model
planar graphs
image stacks
np hard
graph partitioning
np complete problems
thin film
spectral graph
weighted graph
message passing
shortest path
genetic programming
data points