Special Issue on Software Process and Product Measurement.
Juan Jose Cuadrado-GallegoAlain AbranPublished in: J. Syst. Softw. (2008)
Keyphrases
- special issue
- software process
- process improvement
- product quality
- software development
- process model
- ai edam
- applied intelligence
- iso iec
- ecml pkdd
- international journal
- software process improvement
- software engineering
- software quality
- software projects
- requirements engineering
- quality control
- data mining
- real world
- process control
- life cycle
- software systems