Panel: Achieving Success in Measurement and Reliability Modeling.

Ted W. Keller John C. Munson Norman F. Schneidewind George E. Stark

Published in: ISSRE (1993)

Keyphrases

data sets
data mining
machine learning
face recognition
real world
genetic algorithm
learning algorithm
artificial intelligence
feature selection
database systems
bayesian networks
wide range
multiresolution
control system
mobile robot
reliability analysis