A layout-aware x-filling approach for dynamic power supply noise reduction in at-speed scan testing.
Saman KiamehrFarshad FirouziMehdi Baradaran TahooriPublished in: ETS (2013)
Keyphrases
- noise reduction
- power supply
- edge detection
- signal to noise ratio
- noise level
- edge preserving
- noisy environments
- median filter
- edge enhancement
- noise removal
- control unit
- intelligent control
- solar energy
- real time
- speech enhancement
- high frequency
- rbf neural network
- artificial neural networks
- multiscale
- neural network