A deep learning approach to single-particle recognition in cryo-electron microscopy.
Yanan ZhuQi OuyangYoudong MaoPublished in: CoRR (2016)
Keyphrases
- electron microscopy
- deep learning
- low energy
- x ray
- unsupervised learning
- image stacks
- thin film
- machine learning
- unsupervised feature learning
- object recognition
- pattern recognition
- supervised learning
- mental models
- feature extraction
- neural network
- dimensionality reduction
- semi supervised
- learning strategies
- weakly supervised