Automating wafer-level test of uncooled infrared detectors using wafer-prober.
Mohamed MakhloufDiana GollerLutz GendrischStephan KolnsbergFranz VogtAlexander UtzDirk WeilerHolger VogtPublished in: IOLTS (2017)
Keyphrases
- infrared
- infrared images
- multi sensor
- target detection
- infrared imagery
- object detection
- moving target detection
- target detection and tracking
- thermal infrared
- automatic target recognition
- image processing
- electro optical
- hyperspectral
- mobile robot
- thermal imaging
- face recognition
- computer vision
- focal plane
- thermal images
- image analysis
- infrared sensors