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Topological Approach to Automatic Symbolic Macromodel Generation for Analog Integrated Circuits.

Guoyong ShiHanbin HuShuwen Deng
Published in: ACM Trans. Design Autom. Electr. Syst. (2017)
Keyphrases
  • integrated circuit
  • fully automatic
  • topological properties
  • database
  • semi automatic
  • image processing
  • high level
  • signal processing
  • symbolic representation
  • electron beam