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Power and Substrate Noise Tolerance of Configurable Embedded Memories in SoC.

Meng-Fan ChangKuei-Ann Wen
Published in: J. VLSI Signal Process. (2005)
Keyphrases
  • noise tolerance
  • embedded systems
  • noise tolerant
  • power consumption
  • candidate pruning
  • machine learning
  • corner detectors
  • data sets
  • multiscale
  • support vector machine
  • multi class