Determining the optimal probing lot size for the wafer probe operation in semiconductor manufacturing.

Chih-Hsiung Wang

Published in: Eur. J. Oper. Res. (2009)

Keyphrases

semiconductor manufacturing
lot size
process control
lot sizing
lead time
total cost
production planning
production system
finite horizon
optimal control
optimal solution
utility function
multistage
dynamic programming
production cost
setup cost
special case
control system