The Perils and Pitfalls of Block Design for EEG Classification Experiments.
Ren LiJared S. JohansenHamad AhmedThomas V. IlyevskyRonnie B. WilburHari M. BharadwajJeffrey Mark SiskindPublished in: IEEE Trans. Pattern Anal. Mach. Intell. (2021)
Keyphrases
- eeg signals
- pattern recognition
- pattern classification
- case study
- feature space
- feature selection
- support vector machine svm
- user interface
- classification accuracy
- classification systems
- engineering design
- class labels
- training set
- preprocessing
- decision trees
- motor imagery
- classification rate
- classification scheme
- automatic classification
- design process
- design patterns
- software architecture
- svm classifier
- benchmark datasets
- model selection
- support vector
- image processing