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Modeling and Optimization Techniques for Yield-Aware SRAM Post-Silicon Tuning.

Ashish Kumar SinghKu HeConstantine CaramanisMichael Orshansky
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2014)
Keyphrases
  • high speed
  • data transmission
  • databases
  • three dimensional
  • power consumption
  • parameter settings
  • low power
  • rule selection