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Bulk ZnO: Current Status, Challenges, and Prospects.

Vitaliy AvrutinGene CantwellJizhi ZhangJ. J. SongDonald J. SilversmithHadis Morkoç
Published in: Proc. IEEE (2010)
Keyphrases
  • current status
  • future directions
  • lessons learned
  • open questions
  • technical challenges
  • real time
  • real world
  • open issues
  • similarity measure
  • multiscale
  • hidden markov models
  • key issues