Login / Signup
RESIST: a recursive test pattern generation algorithm for path delay faults considering various test classes.
Karl Fuchs
Michael Pabst
Torsten Rössel
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1994)
Keyphrases
</>
generation algorithm
test cases
pattern matching
neural network
case study
data sets
learning algorithm
social networks
bayesian networks
xml documents
mobile robot
software engineering
software testing