On chip testing data converters using static parameters.
Karim ArabiBozena KaminskaMohamad SawanPublished in: IEEE Trans. Very Large Scale Integr. Syst. (1998)
Keyphrases
- data analysis
- data sets
- synthetic data
- data structure
- test data
- input data
- measured data
- data quality
- end users
- knowledge discovery
- image data
- low cost
- data processing
- raw data
- experimental data
- data generation
- original data
- complex data
- database
- missing data
- small number
- high quality
- spatial data
- computer systems
- data collection
- data objects
- data mining
- databases
- real time