Login / Signup

An enhanced slew rate source follower.

John G. KenneyGiri RanganKarthik RamamurthyGabor C. Temes
Published in: IEEE J. Solid State Circuits (1995)
Keyphrases
  • data mining
  • machine learning
  • genetic algorithm
  • case study
  • multiscale
  • special case
  • failure rate