An Efficient Convolutional Neural Network Model Based on Object-Level Attention Mechanism for Casting Defect Detection on Radiography Images.
Chuanfei HuYongxiong WangPublished in: IEEE Trans. Ind. Electron. (2020)
Keyphrases
- object level
- pixel level
- defect detection
- convolutional neural network
- test images
- image data
- three dimensional
- image registration
- lighting conditions
- image features
- input image
- image classification
- image retrieval
- object recognition
- multiple images
- segmentation method
- attention mechanism
- object class
- partial occlusion
- mean shift
- image regions
- higher level
- natural images
- low level
- high level