Self-Checking and Fail-Safe LSIs by Intra-Chip Redundancy.

Nobuyasu Kanekawa Makoto Nohmi Yoshimichi Satoh Hiroshi Satoh

Published in: FTCS (1996)

Keyphrases

high speed
low cost
analog vlsi
programmable logic
high density
physical design
redundancy reduction
single chip
consistency checking
low power
circuit design
high bandwidth
vlsi design
database
multiple description coding
multithreading
vlsi implementation
modular design
power consumption
real time