Testing of a low-VMIN data-aware dynamic-supply 8T SRAM.
Chen-Wei LinChin-Yuan HuangMango Chia-Tso ChaoPublished in: VTS (2013)
Keyphrases
- data sets
- original data
- database
- raw data
- data generation
- dynamic environments
- data sources
- bayesian networks
- data analysis
- data collection
- high quality
- synthetic data
- data acquisition
- neural network
- prior knowledge
- image data
- small number
- high dimensional data
- experimental data
- website
- learning algorithm
- data quality
- historical data