Towards Machine Learning Support for Embedded System Tests.
Stefan ScharobaKai-Uwe BasenerJens BielefeldtHans-Werner WiesbrockMichael HübnerPublished in: DSD (2021)
Keyphrases
- machine learning
- decision trees
- reinforcement learning
- natural language processing
- test data
- artificial intelligence
- feature selection
- decision support
- data sets
- knowledge acquisition
- natural language
- supervised machine learning
- inductive logic programming
- transfer learning
- supervised learning
- information extraction
- knowledge discovery
- end users
- pattern recognition
- information systems
- learning algorithm
- data mining
- neural network