Login / Signup
Fast and Accurate Emissivity and Absolute Temperature Maps Measurement for Integrated Circuits.
Hsueh-Ling Yu
Yih-Lang Li
Tzu-Yi Liao
Tianchen Wang
Shu-Fei Tsai
Yiyu Shi
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2018)
Keyphrases
</>
integrated circuit
surface temperature
absolute position
infrared
high accuracy
highly accurate
neural network
computationally efficient
data sets
data mining
genetic algorithm
learning algorithm
three dimensional
high quality
printed circuit boards
electron beam