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Automated Test-Trace Inspection for Microcontroller Binary Code.

Thomas ReinbacherJörg BrauerDaniel SchachingerAndreas SteiningerStefan Kowalewski
Published in: RV (2011)
Keyphrases
  • binary codes
  • control system
  • image data
  • database
  • data sets
  • neural network
  • training data
  • data structure