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Differential fault analysis of AES: towards reaching its limits.
Subidh Ali
Debdeep Mukhopadhyay
Michael Tunstall
Published in:
J. Cryptogr. Eng. (2013)
Keyphrases
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statistical analysis
artificial intelligence
information systems
image analysis
data sets
social networks
computer vision
decision making
similarity measure
multiresolution
static analysis
fault model