Probabilistic fatigue damage estimation of embedded electronic solder joints under random vibration.
Mayssam JannounYounes AouesEmmanuel PagnaccoPhilippe PougnetAbdelkhalak El HamiPublished in: Microelectron. Reliab. (2017)
Keyphrases
- damage detection
- embedded systems
- continuous valued
- probabilistic model
- bayesian networks
- neural network
- estimation algorithm
- generative model
- database
- digital images
- probabilistic logic
- damage assessment
- parameter estimation
- fault diagnosis
- maximum likelihood estimation
- robust estimation
- uniformly distributed
- intrinsic dimensionality
- case study
- data sets