Design-for-test methods for stand-alone SRAMs at 1 Gb/s/pin and beyond.

Harold Pilo Stu Hall Patrick Hansen Steve Lamphier Chris Murphy

Published in: ITC (2000)

Keyphrases

preprocessing
data sets
experimental design
significant improvement
design decisions
data mining
machine learning
website
reinforcement learning
user interface
design process
benchmark datasets
classification method
computer aided