Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing.

Zeev Barzilai Don Coppersmith Arnold L. Rosenberg

Published in: IEEE Trans. Computers (1983)

Keyphrases

neural network
computer vision
data mining techniques
signal processing
databases
training data
pattern recognition
test cases
frequent patterns
pattern mining
pattern discovery
pattern analysis
temporal patterns
previously unknown