Robustness to Device Degradation in Silicon FeFET-based Reservoir Computing (Invited).

Kasidit Toprasertpong Eishin Nako Shin-Yi Min Zuocheng Cai Seong-Kun Cho Rikuo Suzuki Ryosho Nakane Mitsuru Takenaka Shinichi Takagi

Published in: IRPS (2024)

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