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Contactless Conductivity Measurement for ITO Nanolayers on AsGa Substrats Over a Wide Frequency Range.
Florent Loete
H. Makhloufi
Yann Le Bihan
Denis Mencaraglia
Published in:
IEEE SENSORS (2018)
Keyphrases
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smart card
wide range
real time
data sets
data mining
machine learning
image processing
relational databases
real world
decision trees
three dimensional
face recognition
reinforcement learning
probabilistic model
measurement model