Characterization Summary of Performance, Reliability, and Threshold Voltage Distribution of 3D Charge-Trap NAND Flash Memory.
Weihua LiuFei WuXiang ChenMeng ZhangYu WangXiangfeng LuChangsheng XiePublished in: ACM Trans. Storage (2022)
Keyphrases
- flash memory
- garbage collection
- solid state
- buffer management
- file system
- random access
- main memory
- embedded systems
- disk drives
- b tree
- data storage
- storage devices
- hand held devices
- database systems
- small size
- power system
- memory management
- storage systems
- multi dimensional
- charge coupled device
- transmission line
- data distribution
- database management systems
- low cost
- general purpose
- data analysis
- data structure