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Similarities of lag phenomena and current collapse in field-plate AlGaN/GaN HEMTs with different types of buffer layers.
Ryouhei Tsurumaki
Naohiro Noda
Kazushige Horio
Published in:
Microelectron. Reliab. (2017)
Keyphrases
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natural phenomena
future trends
database
neural network
case study
similarity measure
image analysis
structuring elements
character recognition
multiple layers