Login / Signup
Dynamic Sampling for Risk Minimization in Semiconductor Manufacturing.
Étienne Le Quéré
Stéphane Dauzère-Pérès
Karim Tamssaouet
Cédric Maufront
Stéphane Astie
Published in:
WSC (2020)
Keyphrases
</>
risk minimization
semiconductor manufacturing
empirical risk
uniform convergence
loss function
random sampling
process control
data sets
pairwise
learning algorithm
artificial intelligence
production system
line search