Statistical estimation of leakage power dissipation in nano-scale complementary metal oxide semiconductor digital circuits using generalised extreme value distribution.
Hossein AghababaAlireza KhosropourAli Afzali-KushaBehjat ForouzandehMassoud PedramPublished in: IET Circuits Devices Syst. (2012)
Keyphrases
- extreme values
- statistical estimation
- digital circuits
- nano scale
- metal oxide semiconductor
- analog circuits
- power dissipation
- low power
- low cost
- finite state machines
- integrated circuit
- image sensor
- mixed signal
- power consumption
- data flow
- model based diagnosis
- circuit design
- cmos technology
- computer vision
- power reduction
- digital signal processing
- image formation
- random variables
- probability distribution
- image analysis
- image segmentation