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Single-ended, robust 8T SRAM cell for low-voltage operation.

Liang WenZhentao LiYong Li
Published in: Microelectron. J. (2013)
Keyphrases
  • low voltage
  • random access memory
  • cmos technology
  • power line
  • design considerations
  • power management
  • pattern recognition
  • power consumption
  • leakage current
  • image sequences
  • video sequences
  • low power
  • data transmission