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Analysis of origin of measured 1/f noise in high-power semiconductor laser diodes far below threshold current.

Jian GuanShuxu GuoJin-Yuan WangMin TaoJunsheng CaoFengli Gao
Published in: Microelectron. Reliab. (2016)
Keyphrases
  • high power
  • low power
  • genetic algorithm
  • image processing
  • multiresolution
  • power consumption
  • high density