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A 16nm configurable pass-gate bit-cell register file for quantifying the VMIN advantage of PFET versus NFET pass-gate bit cells.

Jihoon JeongFrancois AtallahHoan NguyenJosh PuckettKeith A. BowmanDavid Hansquine
Published in: CICC (2015)
Keyphrases
  • nm technology
  • database
  • cmos technology
  • nano scale
  • random access memory
  • image analysis
  • cell nuclei
  • microscope images
  • stem cell
  • flip flops
  • fluorescence microscopy images