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A 16nm configurable pass-gate bit-cell register file for quantifying the VMIN advantage of PFET versus NFET pass-gate bit cells.
Jihoon Jeong
Francois Atallah
Hoan Nguyen
Josh Puckett
Keith A. Bowman
David Hansquine
Published in:
CICC (2015)
Keyphrases
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nm technology
database
cmos technology
nano scale
random access memory
image analysis
cell nuclei
microscope images
stem cell
flip flops
fluorescence microscopy images