FPGA-based testing system of NAND-memory multi-chip modules.
Sergey PodryadchikovVadim PutrolaynenMaksim BelyaevMikhail ChuvstvinIgor TabachnikPublished in: Microelectron. J. (2019)
Keyphrases
- low power consumption
- low cost
- flash memory
- application specific
- analog vlsi
- main memory
- storage devices
- level parallelism
- modular design
- memory requirements
- physical design
- memory subsystem
- random access memory
- memory access
- power dissipation
- embedded systems
- power consumption
- test cases
- database management systems
- general purpose
- memory usage
- data storage
- solid state
- efficient implementation
- multithreading
- programmable logic
- source code
- high speed
- memory bandwidth
- real time