Enhancing Generalization of Wafer Defect Detection by Data Discrepancy-aware Preprocessing and Contrast-varied Augmentation.
Chaofei YangHai LiYiran ChenJiang HuPublished in: ASP-DAC (2020)
Keyphrases
- data sets
- high quality
- preprocessing
- data collection
- experimental data
- data processing
- missing data
- data analysis
- training data
- data structure
- raw data
- application domains
- database
- data quality
- historical data
- statistical analysis
- real time
- input data
- knowledge discovery
- data points
- data sources
- data mining techniques
- sensor data
- data mining algorithms
- end users
- data acquisition
- network structure
- original data
- prior knowledge
- computer vision
- defect detection