Distributed automatic test pattern generation with a parallel FAN algorithm.
Stefan RadtkeJens BargfredeWalter AnheierPublished in: ICCD (1995)
Keyphrases
- times faster
- experimental evaluation
- learning algorithm
- computational complexity
- parallel implementation
- linear programming
- computational cost
- cost function
- optimization algorithm
- neural network
- expectation maximization
- k means
- dynamic programming
- high accuracy
- simulated annealing
- np hard
- ant colony optimization
- optimal solution
- multi robot
- search algorithm
- detection algorithm
- tree structure
- matching algorithm
- path planning