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Electrical properties of highly reliable 32Mb FRAM with advanced capacitor technology.
Yoon-Jong Song
Heung-Jin Joo
Seung-Kuk Kang
Hyun-Ho Kim
Jung-Hoon Park
Y. M. Kang
E. Y. Kang
Sung-Young Lee
Kinam Kim
Published in:
Microelectron. Reliab. (2005)
Keyphrases
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highly reliable
electrical properties
times faster
data sets
data processing
artificial intelligence
rapid development
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case study
image sequences
video sequences
personal computer
web intelligence
key technologies