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Application of a Bayesian network to integrated circuit tester diagnosis.

Daniel MittelstadtRobert PaaschBruce D'Ambrosio
Published in: Artif. Intell. Eng. Des. Anal. Manuf. (1995)
Keyphrases
  • integrated circuit
  • bayesian networks
  • decision support
  • probabilistic model
  • electron beam
  • low cost
  • graphical models
  • medical diagnosis