An exact measurement and repair circuit of TSV connections for 128GB/s high-bandwidth memory(HBM) stacked DRAM.
Dong-Uk LeeKyung Whan KimKwan-Weon KimKang Seol LeeSang Jin ByeonJin-Hee ChoHan Ho JinSang Kyun NamJaejin LeeJun Hyun ChunSung-Joo HongPublished in: VLSIC (2014)