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A Floorprint-Based Defect Tolerance for Nano-Scale Application-Specific IC.
Sanghyun Ahn
Zachary D. Patitz
Noh-Jin Park
Hyoung Joong Kim
Nohpill Park
Published in:
IEEE Trans. Instrum. Meas. (2009)
Keyphrases
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application specific
nano scale
general purpose
integrated circuit
defect detection
high bandwidth
cad cam
generally applicable
instruction set
data structure