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A Floorprint-Based Defect Tolerance for Nano-Scale Application-Specific IC.

Sanghyun AhnZachary D. PatitzNoh-Jin ParkHyoung Joong KimNohpill Park
Published in: IEEE Trans. Instrum. Meas. (2009)
Keyphrases
  • application specific
  • nano scale
  • general purpose
  • integrated circuit
  • defect detection
  • high bandwidth
  • cad cam
  • generally applicable
  • instruction set
  • data structure