Quality Estimation of SEM Wafer Images.

Eyal Bartfeld Israel Nadler-Niv

Published in: MVA (1988)

Keyphrases

quality estimation
ground truth
three dimensional
image database
image data
input image
image retrieval
image analysis
image features
edge detection
test images
quality metrics
image processing
image registration
object recognition
keywords
image classification
image regions
precision and recall