Enhanced Diffusion-Based Analysis for Fast Defect Detection in ECPT Image.
Yiping LiangLibing BaiLulu TianXu ZhangChao RenDan ShaoZhenzhong MaMosi SunPublished in: IEEE Trans. Ind. Informatics (2024)
Keyphrases
- defect detection
- image analysis
- single image
- multiscale
- image data
- template matching
- image representation
- image content
- image classification
- input image
- image features
- image segmentation
- image retrieval
- image pixels
- computer vision
- color images
- keypoints
- image regions
- spatial information
- test images
- lighting conditions
- diffusion process
- image processing