Fitting considerations of polynomial device models [semiconductor device modeling].
Timo RahkonenAntti HeiskanenPublished in: ISCAS (4) (2003)
Keyphrases
- modeling framework
- computational modeling
- statistical modeling
- complex systems
- statistical model
- semiconductor devices
- mathematical modeling
- stochastic models
- low cost
- experimental data
- parametric models
- field effect transistors
- parameter estimation
- real time
- model driven
- probability distribution
- prior knowledge
- artificial neural networks
- bayesian networks
- image sequences
- neural network